测量微米级薄膜厚度与弹性模量的一种新方法

测量微米级薄膜厚度与弹性模量的一种新方法

PDF(131 KB)

Journal of Wuhan University of Technology ›› 1999, Vol. 21 ›› Issue (5) : 56-58.

论文

{{article.zuoZhe_EN}}

Author information +

History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

Cite this article

Download Citations

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}

{{article.copyrightLicense_en}}

PDF(131 KB)

Accesses

Citation

Detail

Sections

Recommended

/

〈

〉